HOTPAC : programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML / John Albers.
| Author/creator | Albers, John |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1995. |
| Description | vi, 87 pages ; 28 cm. |
| Subjects |
| Variant title | HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program ... |
| Portion of title | Programs for thermal analysis including version 3.0 of the TXYZ program ... |
| Series | NIST special publication ; 400-96 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NIST special publication 400-96. ^A390056 |
| General note | Distributed to depository libraries in microfiche. |
| General note | Shipping list no.: 95-0785-M. |
| General note | "August 1995." |
| Bibliography note | Includes bibliographical references (p. 47-49). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1995] 2 microfiches : negative. |
| GPO item number | 0247 (MF) |
| Govt. docs number | C 13.10:400-96 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.10:400-96 | ✔ Available |