New horizons in testing latent trait test theory and computerized adaptive testing / edited by David J. Weiss ; contributors, R. Darrell Bock ... [et al.].

Format Electronic
Publication InfoNew York : Academic Press,
Descriptionxvii, 345 p. : ill.
Supplemental ContentFull text available from eBook - Mathematics (Legacy 1) [EBCML1]
Subjects

Other author/creatorWeiss, David J.
Other author/creatorBock, R. Darrell (Richard Darrell), 1927-
Other author/creatorUnited States. Office of Naval Research.
Other author/creatorComputerized Adaptive Testing Conference (1979 : Wayzata, Minn.)
General noteDerived from the 1979 Computerized Adaptive Testing Conference held at Wayzata, Minn., sponsored by the U.S. Office of Naval Research, et al.
Bibliography noteIncludes bibliographies and indexes.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 82024374
ISBN9780127427805
ISBN0127427805

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Electronic Resources Access Content Online ✔ Available