CTL for test information of digital ICs / by Rohit Kapur.
| Author/creator | Kapur, Rohit |
| Format | Electronic |
| Publication Info | Boston : Kluwer Academic Publishers, |
| Description | ix, 173 p. : ill. ; 24 cm. |
| Supplemental Content | Full text available from eBooks on EBSCOhost |
| Subjects |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2002034094 |
| ISBN | 1402072937 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |