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010 a| 2020035725;

020 a| 9781119664000q| (cloth);

020 z| 9781119664017q| (adobe pdf);

020 z| 9781119663942q| (epub);

035 a| (WaSeSS)ssj0002455674;

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100 1 a| Balakrishnan, N.,d| 1956-=| ^A205489;

245 10 a| Accelerated life testing of one-shot devicesh| [electronic resource] :b| data collection and analysis /c| Narayanaswamy Balakrishnan, McMaster University, Hamilton, Canada, Man Ho Ling, The Education University of Hong, Kong, New Territories, Hong Kong, Hon Yiu So, University of Waterloo, Waterloo, Canada.;

250 a| First edition.;

260 a| Hoboken, NJ, USA :b| Wiley,c| 2021.;

263 a| 2102;

300 a| pages cm;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

520 a| "A one-shot device is a unit that performs its function only once and cannot be used for testing more than once. Examples include electric explosive devices, fire extinguishers, airbags in cars, and missiles. While testing one-shot devices, only the condition of the device at a specific inspection time can be recorded, and exact failure times cannot be obtained from the test. As a result, the lifetimes of devices are either left- or right-censored. Due to a lack of lifetime data collected in life-tests, estimating the reliability of one-shot devices in traditional approaches becomes challenging. This book primarily focuses on fundamental issues of statistical modeling based on one-shot device testing data collected from accelerated life-tests. This book also provides advanced statistical techniques. For instance, expectation-maximization algorithms and Bayesian approaches to deal with the estimation challenges, along with comprehensive data analysis of one-shot devices under accelerated life-tests. Readers may apply the techniques from this book to their own lifetime data with censoring. This book is ideal for graduate students, researchers, and engineers working on accelerated life testing data analysis"--c| Provided by publisher.;

538 a| Mode of access: World Wide Web;

650 0 a| Accelerated life testing.=| ^A332944;

650 0 a| Failure analysis (Engineering)=| ^A1260734;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Ling, Man Ho.?| UNAUTHORIZED;

700 1 a| So, Hon Yiu.?| UNAUTHORIZED;

856 40 z| Full text available from eBooks on EBSCOhostu| https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=2750970&scope=site&custid=s5822723&authtype=ip,shib;

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Accelerated life testing of one-shot devices data collection and analysis / Narayanaswamy Balakrishnan, McMaster University, Hamilton, Canada, Man Ho Ling, The Education University of Hong, Kong, New Territories, Hong Kong, Hon Yiu So, University of Waterloo, Waterloo, Canada.

Author/creator	Balakrishnan, N., 1956-
Other author	Ling, Man Ho.
Other author	So, Hon Yiu.
Format	Electronic
Edition	First edition.
Publication Info	Hoboken, NJ, USA : Wiley, 2021.
Description	pages cm
Supplemental Content	Full text available from eBooks on EBSCOhost
Subjects	Accelerated life testing. Failure analysis (Engineering)

Abstract	"A one-shot device is a unit that performs its function only once and cannot be used for testing more than once. Examples include electric explosive devices, fire extinguishers, airbags in cars, and missiles. While testing one-shot devices, only the condition of the device at a specific inspection time can be recorded, and exact failure times cannot be obtained from the test. As a result, the lifetimes of devices are either left- or right-censored. Due to a lack of lifetime data collected in life-tests, estimating the reliability of one-shot devices in traditional approaches becomes challenging. This book primarily focuses on fundamental issues of statistical modeling based on one-shot device testing data collected from accelerated life-tests. This book also provides advanced statistical techniques. For instance, expectation-maximization algorithms and Bayesian approaches to deal with the estimation challenges, along with comprehensive data analysis of one-shot devices under accelerated life-tests. Readers may apply the techniques from this book to their own lifetime data with censoring. This book is ideal for graduate students, researchers, and engineers working on accelerated life testing data analysis"-- Provided by publisher.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2020035725
ISBN	9781119664000 (cloth)
ISBN	(adobe pdf)
ISBN	(epub)

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Accelerated life testing of one-shot devices data collection and analysis / Narayanaswamy Balakrishnan, McMaster University, Hamilton, Canada, Man Ho Ling, The Education University of Hong, Kong, New Territories, Hong Kong, Hon Yiu So, University of Waterloo, Waterloo, Canada.

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