Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation / Edited by: James W. Mayer and James F. Ziegler.
| Author/creator | International Conference on Ion Beam Surface Layer Analysis |
| Format | Book |
| Publication Info | Lausanne : Elsevier Sequoia S.A., 1974. |
| Description | viii, 463 pages : illustrations ; 25 cm |
| Subjects |
| Other author/creator | Mayer, James W., 1930- |
| Other author/creator | Ziegler, J. F. (James F.) |
| Other author/creator | National Science Foundation (U.S.) |
| Other author/creator | International Business Machines Corporation. |
| General note | "These proceedings were originally published in Thin solid films." |
| Bibliography note | Includes bibliographical references. |
| LCCN | 74000348 |
| ISBN | 044419536X |
| Stock number | $41.50 (U.S.) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | General Stacks | QC176.82 .I55 1973 | ✔ Available | Place Hold |