High-k materials in multi-gate FET devices / edited by Shubham Tayal, Parveen Singla, and J. Paulo Davim.

Other author Tayal, Shubham.
Other author Singla, Parveen.
Other author Davim, J. Paulo.
Format Electronic
EditionFirst edition.
Publication InfoBoca Raton, FL : CRC Press, 2021.
Description1 online resource.
Supplemental ContentFull text available from eBooks on EBSCOhost
Supplemental ContentFull text available from Taylor & Francis eBooks
Subjects

SeriesScience, technology, and management series
Contents Introduction to multi-gate FET devices / T. S. Arulananth, S. V. S. Prasad, and K. Srinivas Rao -- High-k gate dielectrics and metal gate stack technology for advance semiconductor devices : an overview / Vibhu Goyal, Shubham Tayal, Shweta Meena, Ravi Gupta, and Sandip Bhattacharya -- Influence of high-k material in gate engineering and in multi-gate field effect transistor devices / C. Usha and P. Vimala -- Trap charges in high-k and stacked dielectric / Annada Shankar Lenka and Prasanna Kumar Sahu -- Impact of high-k dielectric on the gate-induced drain leakage of multi-gate FETs / Varshini K. Amirtha and Shubham Sahay -- Advanced FET design using high-k gate dielectric and characterization for low-power VLSI / P. Vimala and T. S. Arun Samuel -- Simulation and analysis of gate stack DG MOSFET with application of high-k dielectric using visual TCAD / Nisha Yadav, Sunil Jadav, and Gaurav Saini -- Novel architecture in gate all-around (GAA) MOSFET with high-k dielectric for biomolecule detection / Krutideepa Bhol, Biswajit Jena, Umakanta Nanda, Shubham Tayal, and Amit Kumar Jain -- Asymmetric junctionless transistor : a SRAM performance study / Gaurav Saini and Trailokya Nath Sasamal -- Performability analysis of high-k dielectric-based advanced MOSFET in lower technology / Nodes Manoj Angara, Biswajit Jena, and Ayodeji Olalekan Salau.
Abstract "This book focuses on high-k materials for advanced FET devices. It discusses emerging challenges in the engineering and applications and considers issues with associated technologies. This work will be of high interest to researchers in materials science, electronics engineering, IT, and related disciplines studying nanodevices such as FinFET and Tunnel FET and device-circuit codesign issues"-- Provided by publisher.
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Source of descriptionDescription based on print version record and CIP data provided by publisher; resource not viewed.
Issued in other formPrint version: High-k materials in multi-gate FET devices Boca Raton, FL : CRC Press, 2021 9780367639686
Genre/formElectronic books.
LCCN 2021029733
ISBN9781003121589 (ebook)
ISBN(hardback)
ISBN(paperback)

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