Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / Dong ZhiLi.

Author/creator Dong, ZhiLi
Format Electronic
EditionFirst edition.
Publication InfoBoca Raton, FL : CRC Press, 2022.
Descriptionpages cm
Supplemental ContentFull text available from Taylor & Francis eBooks
Supplemental ContentFull text available from eBooks on EBSCOhost
Subjects

SeriesAdvances in materials science and engineering
Abstract "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- Provided by publisher.
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2021056285
ISBN9780367357948 (hbk)
ISBN9781032246802 (pbk)
ISBN(ebk)

Availability

Library Location Call Number Status Item Actions
Electronic Resources ✔ Available