Applying the Rasch Model and Structural Equation Modeling to Higher Education The Technology Satisfaction Model

Author/creator Islam, A. Y. M. Atiquil Author
Format Electronic
Publication InfoBoca Raton : CRC Press LLC
Description148 p. ill 09.190 x 06.130 in.
Supplemental ContentFull text available from Taylor & Francis eBooks
Supplemental ContentFull text available from eBooks on EBSCOhost
Subjects

Summary Annotation This book introduces the fundamentals of the technology satisfaction model (TSM), supporting readers in applying the Rasch model and structural equation modeling (SEM) - a multivariate technique - to higher education (HE) research. User satisfaction is traditionally measured along a single dimension. However, the TSM includes digital technologies for teaching, learning and research across three dimensions: computer efficacy, perceived ease of use and perceived usefulness. Establishing relationships among these factors is a challenge. Although commonly used in psychology to trace relationships, Rasch and SEM approaches are rarely used in educational technology or library and information science. This book, therefore, shows that combining these two analytical tools offers researchers better options for measurement and generalisation in HE research. This title presents theoretical and methodological insights of use to researchers in HE.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9781032471402
ISBN1032471409 (Trade Cloth) Forthcoming
Standard identifier# 9781032471402
Stock number00004766

Availability

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Electronic Resources ✔ Available