Trap level spectroscopy in amorphous semiconductors / Viktor I. Mikla and Victor V. Mikla.

Author/creator Mikla, Victor I.
Other author Mikla, Victor V.
Format Electronic
Edition1st ed.
Publication InfoLondon ; Burlington, MA : Elsevier,
Descriptionvi, 120 p. : ill. ; 24 cm.
Supplemental ContentFull text available from eBook - Materials Science 2010 (Elsevier and Woodhead) [EBCMS10W]
Subjects

SeriesElsevier insights
Elsevier insights. ^A1016922
Contents Defect states spectroscopy in amorphous semiconductors -- Thermally stimulated depolarziation currents in amorphous chalcogenides -- Carrier transport processs in amorphous solids -- Time-of-flight experiments in amorphous chalcogenide semicondutors -- Xerographic spectroscopy of state in mobility gap -- Photoinduced effects on states in the mobility gap -- Spectroscopic studies of gap states and laser-induced structural transformations in Se-based As-free amorphous semiconductors.
Bibliography noteIncludes bibliographical references.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2011278861
ISBN9780123847157 (hbk.)
ISBN012384715X (hbk.)

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