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010 a| 95013386;

020 a| 0750694726 (hardcover : alk. paper);

035 a| (WaSeSS)ssj0000227460;

040 a| DLCc| DLCd| DLCd| WaSeSS;

049 a| EREEa| NEHH;

050 00 a| TK7874b| .A339 1995;

082 00 a| 621.3815/482| 20;

100 1 a| Afshar, Amir.?| UNAUTHORIZED;

245 10 a| Principles of semiconductor network testingh| [electronic resource] /c| Amir Afshar.;

260 a| Boston :b| Butterworth-Heinemann,;

300 a| xiv, 213 p. :b| ill. ;c| 25 cm.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Testing.=| ^A450737;

650 0 a| Semiconductorsx| Testing.=| ^A65728;

655 0 a| Electronic books.=| ^A491897;

856 40 z| Full text available from eBook - Engineering pre-2007u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fwww.sciencedirect.com%2Fscience%2Fbook%2F9780750694728;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

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949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 6598660;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6598660-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 7/18/2025x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6598660-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 7/18/2025x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6598660-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 7/18/2025x| EBOOKz| JERESOURCE;

Principles of semiconductor network testing / Amir Afshar.

Author/creator	Afshar, Amir
Format	Electronic
Publication Info	Boston : Butterworth-Heinemann,
Description	xiv, 213 p. : ill. ; 25 cm.
Supplemental Content	Full text available from eBook - Engineering pre-2007
Subjects	Integrated circuits--Testing. Semiconductors--Testing.

Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	95013386
ISBN	0750694726 (hardcover : alk. paper)

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Principles of semiconductor network testing / Amir Afshar.

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