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010 a| 2009017804;

020 a| 9781891121890 (hardcover : alk. paper);

020 a| 1891121898 (hardcover : alk. paper);

035 a| (WaSeSS)ssj0000550793;

049 a| EREEa| NEHH;

050 00 a| TK7871.95b| .G36 2010;

082 00 a| 621.3815/2842| 22;

100 1 a| Gao, Jianjun,d| 1968-=| ^A1275513;

245 10 a| RF and microwave modeling and measurement techniques for field effect transistorsh| [electronic resource] /c| Jianjun Gao.;

260 a| Raleigh, NC :b| SciTech Pub.,;

300 a| x, 339 p. :b| ill. ;c| 24 cm.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Field-effect transistorsx| Testing.=| ^A86561;

650 0 a| Compound semiconductorsx| Testing.=| ^A246051;

650 0 a| Field-effect transistorsx| Mathematical models.=| ^A86561;

650 0 a| Compound semiconductorsx| Mathematical models.=| ^A246051;

650 0 a| Microwave measurements.=| ^A53278;

650 0 a| Radio measurements.=| ^A207614;

655 0 a| Electronic books.=| ^A491897;

856 40 z| Full text available from IET Digital Library - Booksu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fdigital-library.theiet.org%2Fdoi%2Fbook%2F10.1049%2FSBEW027E;

947 a| (OCoLC)ocn320621684;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 6476986;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6476986-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 9/14/2024x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6476986-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 9/14/2024x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6476986-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 9/14/2024x| EBOOKz| JERESOURCE;

RF and microwave modeling and measurement techniques for field effect transistors / Jianjun Gao.

Author/creator	Gao, Jianjun, 1968-
Format	Electronic
Publication Info	Raleigh, NC : SciTech Pub.,
Description	x, 339 p. : ill. ; 24 cm.
Supplemental Content	Full text available from IET Digital Library - Books
Subjects	Field-effect transistors--Testing. Compound semiconductors--Testing. Field-effect transistors--Mathematical models. Compound semiconductors--Mathematical models. Microwave measurements. Radio measurements.

Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2009017804
ISBN	9781891121890 (hardcover : alk. paper)
ISBN	1891121898 (hardcover : alk. paper)

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RF and microwave modeling and measurement techniques for field effect transistors / Jianjun Gao.

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