International Test Conference in Asia
| Author/creator | International Test Conference in Asia |
| Other author | Institute of Electrical and Electronics Engineers. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, NJ : IEEE |
| Supplemental Content | Click here for full text |
| Uniform title | International Test Conference in Asia (Online) |
| Variant title | ITC-Asia |
| Variant title | Proceedings, International Test Conference in Asia |
| Variant title | Test Conference in Asia (ITC-Asia), International |
| Frequency | Annual |
| Access restriction | Available only to authorized users. |
| Other forms | Also available in print. |
| Technical details | Mode of access: World Wide Web. |
| Source of description | Description based on: 2017; title from proceedings home page (publisher's website viewed April 29, 2021). |
| Source of description | Latest issue consulted: 2020 (viewed April 29, 2021). |
| Issued in other form | Print version: International Test Conference in Asia. International Test Conference in Asia 2768-0681 |
| Genre/form | Electronic journals. |
| LCCN | 2021201998 |
| ISSN | 2768-069X |
| Stock number | 445 Hoes Lane, Piscataway, NJ 08854 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |