Proceedings / Annual IEEE Semiconductor Thermal Measurement and Management Symposium.
| Author/creator | IEEE Semiconductor Thermal Measurement and Management Symposium |
| Other author | IEEE Components, Hybrids, and Manufacturing Technology Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | New York, NY : Institute of Electrical and Electronics Engineers, 1991- |
| Supplemental Content | Click here for full text |
| Subjects |
| Uniform title | Proceedings (Online) |
| Running title | IEEE SEMI-THERM Symposium |
| Variant title | Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| Variant title | Annual Semiconductor Thermal Measurement and Management Symposium |
| Variant title | SEMI-THERM |
| Variant title | Semiconductor Thermal Measurement and Management Symposium |
| Frequency | Annual |
| Access restriction | Available only to authorized users. |
| Other forms | Also available in print. |
| Technical details | Mode of access: World Wide Web. |
| Issuing body | Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society. |
| Action note | digitized 2010 HathiTrust Digital Library committed to preserve |
| Action note | digitized 2010 HathiTrust Digital Library committed to preserve |
| Action note | digitized 2010 HathiTrust Digital Library committed to preserve |
| Action note | digitized 2010 HathiTrust Digital Library committed to preserve |
| Action note | digitized 2010 HathiTrust Digital Library committed to preserve |
| Action note | digitized 2010 HathiTrust Digital Library committed to preserve |
| Action note | digitized 2010 HathiTrust Digital Library committed to preserve |
| Action note | digitized 2010 HathiTrust Digital Library committed to preserve |
| Source of description | Description based on print version record. |
| Source of description | Latest issue consulted: 33rd (2017) (IEEExplore viewed Feb. 27, 2018). |
| Preceding title | IEEE Semiconductor Thermal and Temperature Measurement Symposium. Proceedings |
| Issued in other form | Print version: IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings 1065-2221 |
| Genre/form | Electronic journals. |
| LCCN | 2018200150 |
| ISSN | 2577-1000 1065-2221 1065-2221 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |