International Conference on Test and Measurement [proceedings].
| Author/creator | International Conference on Test and Measurement |
| Other author | Institute of Electrical and Electronics Engineers. |
| Other author | IEEE Instrumentation and Measurement Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, NJ : Institute of Electrical and Electronic Engineers |
| Supplemental Content | Click here for full text |
| Subjects |
| Uniform title | International Conference on Test and Measurement (Online) |
| Variant title | Also know in some providers as: Proceedings ... International Conference on Test and Measurement |
| Variant title | ICTM |
| Variant title | Conference on Test and Measurement |
| Frequency | Annual |
| Access restriction | Available only to authorized users. |
| Other forms | Also available in print. |
| Technical details | Mode of access: World Wide Web. |
| Source of description | Description based on print version record. |
| Issued in other form | Also in print: International Conference on Test and Measurement. International Conference on Test and Measurement : [proceedings] 2157-5592 |
| Genre/form | Electronic journals. |
| LCCN | 2010204160 |
| ISSN | 2157-5606 |
| Stock number | Institute of Electrical and Electronics Engineers, IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |