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111 2 a| IEEE International Conference on Computational Intelligence for Measurement Systems and Applications.?| UNAUTHORIZED;

210 0 a| IEEE Int. Conf. Comput. Intell. Meas. Syst. Appli.b| (Online);

222 0 a| IEEE International Conference on Computational Intelligence for Measurement Systems and Applicationsb| (Online);

240 10 a| IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (Online)?| UNAUTHORIZED;

245 10 a| IEEE International Conference on Computational Intelligence for Measurement Systems and Applicationsh| [electronic resource] :b| [proceedings].;

246 3 a| International Conference on Computational Intelligence for Measurement Systems and Applications;

246 3 a| Computational intelligence for measurement systems and applications;

246 3 a| CIMSA proceedings;

260 a| Piscataway, N.J. :b| Institute of Electrical and Electronics Engineers;

362 1 a| Began in 2004; ceased in 2012.;

506 a| Available only to authorized users.;

530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

588 a| Description based on print.;

650 0 a| Computational intelligencex| Industrial applicationsv| Congresses.=| ^A374447;

650 0 a| Neural networks (Computer science)v| Congresses.=| ^A260797;

650 0 a| Fuzzy systemsv| Congresses.=| ^A561244;

650 0 a| Soft computingv| Congresses.=| ^A423103;

650 0 a| Automatic controlx| Data processingv| Congresses.=| ^A1235737;

650 0 a| Measurementv| Congresses.=| ^A910528;

655 0 a| Electronic journals.=| ^A353035;

710 2 a| Institute of Electrical and Electronics Engineers.1| https://id.oclc.org/worldcat/entity/E39QH7JmppbjgFY6j8mDDMWwRg.=| ^A9546;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

780 00 a| IEEE International Symposium on Computational Intelligence for Measurement Systems and Applications.t| IEEE International Symposium on Computational Intelligence for Measurement Systems and Applications [proceedings];

785 00 a| IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications.t| ... IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applicationsx| 2377-9322w| (DLC) 2015204033w| (OCoLC)888347229;

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IEEE International Conference on Computational Intelligence for Measurement Systems and Applications [proceedings].

Author/creator	IEEE International Conference on Computational Intelligence for Measurement Systems and Applications
Other author	Institute of Electrical and Electronics Engineers.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Piscataway, N.J. : Institute of Electrical and Electronics Engineers
Supplemental Content	Click here for full text
Subjects	Computational intelligence--Industrial applications. --Congresses. Neural networks (Computer science)--Congresses. Fuzzy systems--Congresses. Soft computing--Congresses. Automatic control--Data processing. --Congresses. Measurement--Congresses.

Uniform title	IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (Online)
Variant title	International Conference on Computational Intelligence for Measurement Systems and Applications
Variant title	Computational intelligence for measurement systems and applications
Variant title	CIMSA proceedings
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Source of description	Description based on print.
Preceding title	IEEE International Symposium on Computational Intelligence for Measurement Systems and Applications. IEEE International Symposium on Computational Intelligence for Measurement Systems and Applications [proceedings]
Succeeding title	IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications. ... IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications 2377-9322
Issued in other form	Print version: IEEE International Conference on Computational Intelligence for Measurement Systems and Applications. IEEE International Conference on Computational Intelligence for Measurement Systems and Applications [proceedings] 2159-1547
Genre/form	Electronic journals.
LCCN	2010203573
ISSN	2159-1555
Stock number	IEEE, 445 Hoes Ln. Piscataway NJ 08854

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IEEE International Conference on Computational Intelligence for Measurement Systems and Applications [proceedings].

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