Tools

LEADER 03864cas a22006977a 4500

001 ssj0020148;

003 WaSeSS;

005 20251212090320.0;

006 m d ;

007 cr n ;

008 100414c19949999cauar s 1 a0eng d;

010 a| 2018201214;

022 0 a| 2576-9154y| 1087-48522| 1;

023 0 a| 1087-48522| 1;

029 1 a| AU@b| 000044927532;

029 1 a| AU@b| 000045714863;

029 1 a| NZ1b| 12143393;

029 1 a| AU@b| 000061627521;

029 1 a| DKDLAb| 820120-katalog:999921661705765;

035 a| (WaSeSS)ssj0020148;

037 b| IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854;

042 a| dlra| xlca| nsdp;

049 a| EREEa| NEHH;

050 4 a| TK7895.M4;

082 10 a| 0042| 231| https://id.oclc.org/worldcat/ddc/E3crFxr84MQkDt9mHBYTvbkPCB;

111 2 a| IEEE International Workshop on Memory Technology, Design, and Testing.=| ^A728655;

210 0 a| Rec. IEEE Int. Workshop Mem. Technol. Des. Test.b| (Online);

222 0 a| Records of the IEEE International Workshop on Memory Technology, Design, and Testingb| (Online);

240 10 a| Records of the IEEE International Workshop on Memory Technology, Design, and Testing (Online)=| ^A728655;

245 10 a| Records of the IEEE International Workshop on Memory Technology, Design, and Testingh| [electronic resource] /c| sponsored by the IEEE Computer Society Technical Committee on Test Technology ; in cooperation with the IEEE Computer Society Technical Committee on VLSI.;

246 30 a| Memory Technology, Design, and Testing;

246 1 a| ... IEEE International Workshop on Memory Technology, Design and Testing (MDTD);

260 a| Los Alamitos, Calif. :b| IEEE Computer Society Press;

310 a| Annual;

362 1 a| Began with: Aug. 8-9 (1994).;

506 a| Available only to authorized users.;

530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

583 1 a| digitizedc| 2010h| HathiTrust Digital Libraryl| committed to preserve2| pda5| MiAaHDL;

588 a| Description based on: 1995; title from pdf image (ieeexplore.ieee.org website, viewed Feb. 14, 2018).;

588 a| Latest issue consulted: 2009 (viewed Feb. 14, 2018).;

650 0 a| Semiconductor storage devicesx| Testingv| Congresses.=| ^A90527;

650 0 a| Random access memoryv| Congresses.=| ^A429975;

655 0 a| Electronic journals.=| ^A353035;

710 2 a| IEEE Computer Society.b| Test Technology Technical Committee.=| ^A724761;

710 2 a| IEEE Computer Society.b| Technical Committee on VLSI.=| ^A559676;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Click here for full textu| http://JW3MH2CM6N.search.serialssolutions.com/?V=1.0&L=JW3MH2CM6N&S=JCs&C=RECOOFTHI&T=marc;

947 a| (OCoLC)607374162;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER123;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL79;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC61;

583 1 a| digitizedc| 2010h| HathiTrust Digital Libraryl| committed to preserve2| pda5| MiAaHDL;

596 a| 1 3 4;

998 a| 6339494;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6339494-1001l| JNETm| JOYNERr| Ys| Yt| JNESSJOu| 4/13/2024x| EJOURNALz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6339494-2001l| HSLELECm| HSLr| Ys| Yt| HELECu| 4/13/2024x| EJOURNALz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6339494-3001l| MNETm| JMUSICr| Ys| Yt| MNESSJOu| 4/13/2024x| EJOURNALz| JERESOURCE;

Records of the IEEE International Workshop on Memory Technology, Design, and Testing / sponsored by the IEEE Computer Society Technical Committee on Test Technology ; in cooperation with the IEEE Computer Society Technical Committee on VLSI.

Author/creator	IEEE International Workshop on Memory Technology, Design, and Testing
Other author	IEEE Computer Society. Test Technology Technical Committee.
Other author	IEEE Computer Society. Technical Committee on VLSI.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Los Alamitos, Calif. : IEEE Computer Society Press
Supplemental Content	Click here for full text
Subjects	Semiconductor storage devices--Testing. --Congresses. Random access memory--Congresses.

Uniform title	Records of the IEEE International Workshop on Memory Technology, Design, and Testing (Online)
Portion of title	Memory Technology, Design, and Testing
Variant title	... IEEE International Workshop on Memory Technology, Design and Testing (MDTD)
Frequency	Annual
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Action note	digitized 2010 HathiTrust Digital Library committed to preserve
Action note	digitized 2010 HathiTrust Digital Library committed to preserve
Action note	digitized 2010 HathiTrust Digital Library committed to preserve
Source of description	Description based on: 1995; title from pdf image (ieeexplore.ieee.org website, viewed Feb. 14, 2018).
Source of description	Latest issue consulted: 2009 (viewed Feb. 14, 2018).
Issued in other form	Print version: IEEE International Workshop on Memory Technology, Design, and Testing. Records of the IEEE International Workshop on Memory Technology, Design, and Testing 1087-4852
Genre/form	Electronic journals.
LCCN	2018201214
ISSN	2576-9154 1087-4852
Stock number	IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854

Availability

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	Electronic Resources	Access Content Online	✔ Available

Records of the IEEE International Workshop on Memory Technology, Design, and Testing / sponsored by the IEEE Computer Society Technical Committee on Test Technology ; in cooperation with the IEEE Computer Society Technical Committee on VLSI.

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