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Proceedings / Testing, Academic & Industrial Conference--Practice And Research Techniques.

Author/creator	Testing: Academic & Industrial Conference--Practice and Research Techniques
Format	Electronic
Publication Info	Los Alamitos, California. : IEEE Computer Society, 2006-2009.
Supplemental Content	Click here for full text
Subjects	Computer software--Testing. --Congresses.

Other author/creator	IEEE Computer Society. https://id.oclc.org/worldcat/entity/E39QQPVp7YRxjbcrXVPYHxVD3F.
Other author/creator	Engineering and Physical Sciences Research Council. https://id.oclc.org/worldcat/entity/E39QH7JmqRP8qgQbhc3HkTG43F.
Other author/creator	IEEE Xplore (Online service)
Other author/creator	Mutation (Conference) 2007:
Uniform title	Proceedings (Online)
Portion of title	Testing, Academic & Industrial Conference--Practice and Research Techniques
Variant title	TAIC PART
Variant title	TAICPART-MUTATION 2007
Frequency	Annual
General note	TAIC PART 2007 co-located with Mutation 2007.
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Source of description	2006; title from pdf of title page (IEEE Xplore, viewed June 7, 2017).
Source of description	2009 (viewed June 7, 2017).
Issued in other form	Print version: Testing: Academic & Industrial Conference--Practice and Research Techniques. Proceedings 2997-7517
Genre/form	Electronic journals.
LCCN	2017247534
ISSN	2997-7509

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Proceedings / Testing, Academic & Industrial Conference--Practice And Research Techniques.

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