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111 2 a| International Test Conference.=| ^A728308;

210 0 a| Proc.b| (Int. Test Conf. Online);

222 0 a| Proceedingsb| (International Test Conference. Online);

240 10 a| Proceedings (Online)=| ^A728308;

245 10 a| Proceedingsh| [electronic resource] /c| International Test Conference.;

246 1 i| Title on IEEE Computer Society Proceedings list:a| International Test Conference;

246 1 a| ITC;

246 14 a| IEEE ... Test Conferencef| 1983-1986;

246 14 a| IEEE International Test Conferencef| 1987-;

246 1 a| Proceedings of the International Test Conference;

260 a| [Silver Spring, Md.] :b| [IEEE Computer Society Press];

260 2 3| <1995-> :a| Altoona, PA :b| International Test Conference;

260 3 3| <2014> :a| Washington, D.C. :b| International Test Conference;

310 a| Annual;

362 1 a| Print began with 1983.;

500 a| Some conferences also have distinctive titles.;

500 a| Published: Altoona, PA : International Test Conference, <1995->;

506 a| Available only to authorized users.;

530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

550 a| Sponsored by the IEEE Computer Society, Test Technology Committee, and the IEEE, Philadelphia Section.;

588 1 a| 2014 (ieeexplore.ieee.org viewed April 3, 2015).;

588 0 a| Print version record.;

650 0 a| Computer storage devicesv| Congresses.=| ^A1236873;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 0 a| Semiconductor storage devicesx| Testingv| Congresses.=| ^A90527;

655 0 a| Electronic journals.=| ^A353035;

710 2 a| IEEE Computer Society.1| https://id.oclc.org/worldcat/entity/E39QQPVp7YRxjbcrXVPYHxVD3F.=| ^A53823;

710 2 a| Institute of Electrical and Electronics Engineers.1| https://id.oclc.org/worldcat/entity/E39QH7JmppbjgFY6j8mDDMWwRg.=| ^A9546;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

780 00 a| International Test Conference.t| Digest of papers;

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Proceedings / International Test Conference.

Author/creator	International Test Conference
Other author	IEEE Computer Society.
Other author	Institute of Electrical and Electronics Engineers.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	[Silver Spring, Md.] : [IEEE Computer Society Press]
Publication Info	<1995-> : Altoona, PA : International Test Conference
Publication Info	<2014> : Washington, D.C. : International Test Conference
Supplemental Content	Click here for full text
Subjects	Computer storage devices--Congresses. Integrated circuits--Testing. --Congresses. Semiconductor storage devices--Testing. --Congresses.

Uniform title	Proceedings (Online)
Variant title	Title on IEEE Computer Society Proceedings list: International Test Conference
Variant title	ITC
Cover title	IEEE ... Test Conference 1983-1986
Cover title	IEEE International Test Conference 1987-
Variant title	Proceedings of the International Test Conference
Frequency	Annual
General note	Some conferences also have distinctive titles.
General note	Published: Altoona, PA : International Test Conference, <1995->
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Issuing body	Sponsored by the IEEE Computer Society, Test Technology Committee, and the IEEE, Philadelphia Section.
Source of description	2014 (ieeexplore.ieee.org viewed April 3, 2015).
Source of description	Print version record.
Preceding title	International Test Conference. Digest of papers
Issued in other form	Print version: International Test Conference. Proceedings 1089-3539
Genre/form	Electronic journals.
LCCN	2015202262
ISSN	2378-2250 1089-3539

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Proceedings / International Test Conference.

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