Oxide Reliability A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

Author/creator Dumin, D. J. Author
Format Electronic
Publication InfoHackensack : World Scientific Publishing Company, Incorporated Boulder : NetLibrary, Incorporated [Distributor]
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects

Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9789812778062
ISBN9812778063 (E-Book) Active Record
Stock number00041155

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Electronic Resources Access Content Online ✔ Available