Meeting the tests of time International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
| Author/creator | International Test Conference |
| Other author | IEEE Computer Society. Test Technology Technical Committee. |
| Other author | IEEE Computer Society. Philadelphia Chapter. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Washington : IEEE Computer Society Press, |
| Description | xxxiv, 959 p. : ill. ; 29 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| General note | "IEEE catalog number 89CH2742-5"--T.p. verso. |
| Bibliography note | Includes bibliographical references. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 89083677 |
| ISBN | 0818689625 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |