Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits
| Author/creator | International Symposium on the Physical & Failure Analysis of Integrated Circuits |
| Format | Electronic |
| Publication Info | Piscataway, N.J. : IEEE Service Center |
| Supplemental Content | Click here for full text |
| Subjects |
| Other author/creator | Institute of Electrical and Electronics Engineers. https://id.oclc.org/worldcat/entity/E39QH7JmppbjgFY6j8mDDMWwRg. |
| Other author/creator | IEEE Singapore Section. https://id.oclc.org/worldcat/entity/E39QQPVp7W3RtydvFhD7qkgwxt. |
| Other author/creator | IEEE Electron Devices Society. https://id.oclc.org/worldcat/entity/E39QQPVp7TBrDkHvVrTHg9Kvgg. |
| Other author/creator | IEEE Xplore (Online service) |
| Uniform title | Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits (Online) |
| Other title | IPFA ... proceedings |
| Other title | Proceedings of the ... International Symposium on the Physical and Failure Analysis of Integrated Circuits |
| Variant title | Title on some added title pages: International Symposium on the Physical and Failure Analysis of Integrated Circuits |
| Variant title | Available from some distributers as: ... IEEE ... International Symposium on the Physical and Failure Analysis of Integrated Circuits |
| Access restriction | Available only to authorized users. |
| Other forms | Also available in print. |
| Technical details | Mode of access: World Wide Web. |
| Issuing body | Conference for <1995> organized by IEEE Singapore Section, co-sponsored by IEEE Electron Devices Society. |
| Source of description | 5th ('95); title from caption (IEEEexplore website, viewed January 8, 2008). |
| Source of description | 24th (2017) (IEEE Xplore website, viewed August 6, 2020). |
| Issued in other form | Print version: International Symposium on the Physical & Failure Analysis of Integrated Circuits. Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits 1946-1542 |
| Genre/form | Electronic journals. |
| LCCN | 2009200004 |
| ISSN | 1946-1550 1946-1542 |
| Stock number | IEEE, 445 Hoes Ln., Piscataway, NJ 08854 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |