Logic testing and design for testability / Hideo Fujiwara.
| Author/creator | Fujiwara, Hideo |
| Format | Electronic |
| Publication Info | Cambridge, Mass. : MIT Press, |
| Description | x, 284 p. : ill. ; 24 cm. |
| Supplemental Content | Full text available from MIT Press Direct to Open Backfile STEAM Monographs D2O |
| Subjects |
| Series | MIT Press series in computer systems |
| General note | Includes index. |
| Bibliography note | Bibliography: p. [272]-278. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 85000084 |
| ISBN | 0262060965 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |