Proceedings of the ... IEEE VLSI Test Symposium VTS

Proceedings of the ... IEEE VLSI Test Symposium : VTS.

Author/creator	IEEE VLSI Test Symposium
Other author/creator	IEEE Computer Society. Test Technology Technical Committee.
Other author/creator	Institute of Electrical and Electronics Engineers. Philadelphia Section.
Other author/creator	IEEE Xplore (Online service)
Format	Electronic, Book, and Journal
Publication Info	[Los Alamitos, Calif.] : [IEEE Computer Society Press]
Supplemental Content	Click here for full text
Subject(s)	Integrated circuits--Very large scale integration --Testing --Congresses.

Uniform title	Proceedings of the ... IEEE VLSI Test Symposium (Online)
Portion of title	IEEE VLSI Test Symposium
Portion of title	IEEE Very Large Scale Integration Test Symposium
Portion of title	VLSI Test Symposium
Variant title	Very Large Scale Integration Test Symposium
Portion of title	VTS
Portion of title	Proceedings ... IEEE ... VLSI Test Symposium
Frequency	Annual
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Issuing body	Print version sponsored by the IEEE Computer Society Technical Committee on Test Technology [and] IEEE Philadelphia Section.
Title history note	Original print version of this title was preceded by an earlier title called: IEEE VLSI Test Symposium. Digest of papers.
Source of description	13th (1995); title from PDF running title (IEEE Digital Library Web site, viewed on November 2, 2005).
Source of description	38th (2020) (IEEE Xplore website, viewed July 31, 2020).
Genre/form	Electronic journals.
LCCN	2005262240
ISSN	2375-1053 1093-0167

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Access Content Online	✔ Available