Local resistance measurement for degradation of c-Si heterojunction with intrinsic thin layer (HIT) solar modules : preprint / Chun-Sheng Jiang [and 6 others].

Author/creator Jiang, C.-S. author.
Other author National Renewable Energy Laboratory (U.S.) issuing body.
Other author United States. Department of Energy, sponsoring body.
Format Electronic
PublicationGolden, CO : National Renewable Energy Laboratory, August 2020.
Description1 online resource (5 pages) : color illustrations.
Supplemental Contenthttps://purl.fdlp.gov/GPO/gpo193469
Subjects

SeriesConference paper / NREL ; NREL/CP-5K00-76041
Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5K00-76041. ^A755847
General noteIn scope of the U.S. Government Publishing Office Cataloging and Indexing Program (C&I) and Federal Depository Library Program (FDLP).
General note"August 2020."
General note"Presented at the 47th IEEE Photovoltaic Specialists Conference (PVSC 47), June 15-August 21, 2020"--Cover.
General noteGPO Cataloging Record Distribution Program (CRDP).
Bibliography noteIncludes bibliographical references (page 5).
Funding informationDE-AC36-08GO28308
Source of descriptionDescription based on online resource; title from PDF title page (NREL, viewed February 23, 2021).
GPO item number0430-P-04 (online)
Govt. docs number E 9.17:NREL/CP-5 K 00-76041

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available