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LEADER 02247cam a2200529 i 4500

001 ssj0001657830;

003 WaSeSS;

005 20260812090312.0;

006 m d ;

007 cr n ;

008 160105t20152015ja a sb 000 0 eng d;

010 a| 2016930107;

020 a| 9784431557999 (pbk.);

020 a| 4431557997 (pbk.);

020 z| 9784431558002 (online);

024 3 a| 9784431557999;

035 a| (WaSeSS)ssj0001657830;

042 a| pcc;

049 a| EREEa| NEHH;

050 00 a| QC611.8.S5b| D43 2015;

245 00 a| Defects and impurities in silicon materialsh| [electronic resource] :b| an introduction to atomic-level silicon engineering /c| Yutaka Yoshida, Guido Langouche, editors.;

260 a| Tokyo :b| Springer,c| [2015];

300 a| xv, 487 pages :b| illustrations (partly color) ;c| 24 cm;

490 1 a| Lecture notes in physics,x| 0075-8450 ;v| volume 916;

504 a| Includes bibliographical references.;

506 a| Available only to authorized users.;

530 a| Also issued online.;

538 a| Mode of access: World Wide Web;

650 0 a| Siliconx| Defects.;

650 0 a| Semiconductorsx| Defects.;

650 0 a| Materialsx| Defects.;

655 0 a| Electronic books.;

700 1 a| Yoshida, Yutakac| (Materials scientist);

700 1 a| Langouche, Guidoc| (Materials scientist);

776 0 w| (GyWOH)har160185778;

830 0 a| Lecture notes in physics ;v| 916.x| 0075-8450;

856 40 z| Full text available from Ebook Central - Academic Completeu| https://ebookcentral.proquest.com/lib/eastcarolina/detail.action?docID=6302873;

947 a| (OCoLC)ocn947281266;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 6021674;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6021674-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 4/20/2023x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6021674-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 4/20/2023x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6021674-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 4/20/2023x| EBOOKz| JERESOURCE;

Defects and impurities in silicon materials an introduction to atomic-level silicon engineering / Yutaka Yoshida, Guido Langouche, editors.

Other author	Yoshida, Yutaka (Materials scientist)
Other author	Langouche, Guido (Materials scientist)
Format	Electronic
Publication Info	Tokyo : Springer, [2015]
Description	xv, 487 pages : illustrations (partly color) ; 24 cm
Supplemental Content	Full text available from Ebook Central - Academic Complete
Subjects	Silicon--Defects. Semiconductors--Defects. Materials--Defects.

Series	Lecture notes in physics, 0075-8450 ; volume 916 Lecture notes in physics ; 916. 0075-8450
Bibliography note	Includes bibliographical references.
Access restriction	Available only to authorized users.
Other forms	Also issued online.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2016930107
ISBN	9784431557999 (pbk.)
ISBN	4431557997 (pbk.)
Standard identifier#	9784431557999

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Defects and impurities in silicon materials an introduction to atomic-level silicon engineering / Yutaka Yoshida, Guido Langouche, editors.

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