Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems April 18-21, 2007, Kraków, Poland / sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Silesian University of Technology ; editors, P. Girard ... [et al.].

Other author/creatorGirard, Patrick, Ph. D.
Other author/creatorIEEE Computer Society. Technical Council on Test Technology.
Other author/creatorPolitechnika Śląska im. W. Pstrowskiego.
Other author/creatorIEEE Xplore (Online service)
Portion of title 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
General note"IEEE catalog number: 06EX1759"--T.p. verso.
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2007923137
ISBN1424411610 (softbound ed.)