Tools

LEADER 03530cam a22005777a 4500

001 ssj0000395882;

003 WaSeSS;

005 20240612185429.0;

006 m d ;

007 cr n ;

008 060512s2005 njua sb 101 0 eng d;

010 a| 2006276365;

020 a| 0780393015;

035 a| (WaSeSS)ssj0000395882;

042 a| lccopycat;

049 a| EREEa| NEHH;

050 00 a| TK7874b| .I47377 2005;

082 00 a| 621.3815028/72| 22;

111 2 a| International Symposium on the Physical & Failure Analysis of Integrated Circuitsn| (12th :d| 2005 :c| Singapore)?| UNAUTHORIZED;

245 10 a| Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuitsh| [electronic resource] :b| IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore] /c| edited by Tung Chih-Hang ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapoer Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Singapoer Chapter.;

246 30 a| IPFA 2005;

246 30 a| Physical & failure analysis of integrated circuits;

260 a| Piscataway, N.J. :b| IEEE,;

300 a| 213 p. :b| ill. ;c| 30 cm.;

500 a| "IEEE Catalog Number 05TH8827"--T.p. verso.;

500 a| Issues for 18th (2011)- cataloged as a serial in LC.5| DLC;

504 a| Includes bibliographical references and authors index.;

506 a| Available only to authorized users.;

530 a| Also issued online with additional title: Physical and Failure Analysis of Integrated Circuits, 2005, IPFA 2005, Proceedings of the 12th International Symposium on the.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Defectsv| Congresses.=| ^A42814;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Tung, Chih-Hang,d| 1963-?| UNAUTHORIZED;

710 2 a| IEEE Singapore Section.b| Reliability/CPMT/EDS Chapter.?| UNAUTHORIZED;

710 2 a| IEEE Electron Devices Society.=| ^A85580;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

740 0 a| Physical and Failure Analysis of Integrated Circuits, 2005, IPFA 2005, Proceedings of the 12th International Symposium on the.;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D9910;

856 40 z| Full text available from IEEE Conference Proceedings Archive 2005-2009u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D9910;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D9910;

947 a| (OCoLC)ocm61764103;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 5936749;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5936749-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 11/16/2022x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5936749-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 11/16/2022x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5936749-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 11/16/2022x| EBOOKz| JERESOURCE;

Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore] / edited by Tung Chih-Hang ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapoer Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with IEEE Reliability/CPMT/ED Singapoer Chapter.

Author/creator	International Symposium on the Physical & Failure Analysis of Integrated Circuits
Format	Electronic
Publication Info	Piscataway, N.J. : IEEE,
Description	213 p. : ill. ; 30 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Supplemental Content	Full text available from IEEE Conference Proceedings Archive 2005-2009
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects	Integrated circuits--Defects. --Congresses. Integrated circuits--Testing. --Congresses.

Other author/creator	Tung, Chih-Hang, 1963-
Other author/creator	IEEE Singapore Section. Reliability/CPMT/EDS Chapter.
Other author/creator	IEEE Electron Devices Society.
Other author/creator	IEEE Xplore (Online service)
Portion of title	IPFA 2005
Portion of title	Physical & failure analysis of integrated circuits
General note	"IEEE Catalog Number 05TH8827"--T.p. verso.
General note	Issues for 18th (2011)- cataloged as a serial in LC.
Bibliography note	Includes bibliographical references and authors index.
Access restriction	Available only to authorized users.
Other forms	Also issued online with additional title: Physical and Failure Analysis of Integrated Circuits, 2005, IPFA 2005, Proceedings of the 12th International Symposium on the.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
Other title	Physical and Failure Analysis of Integrated Circuits, 2005, IPFA 2005, Proceedings of the 12th International Symposium on the.
LCCN	2006276365
ISBN	0780393015

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL)	✔ Available

Click here for more information about this title

Availability