DFT 2005 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (03-05 October 2005/Monterey, CA)
| Author/creator | Aitken, Robert Editor |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 616 p. 09.000 x 06.000 in. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation DFT 2005 showcases the latest research results on yield analysis and modeling, scan design and test data compression, reconfiguration, error correcting codes and circuits, and fault detection and tolerance for sensor and flash memory. Its also covers delay fault test and timing consideration, interconnect test, approaches for soft error, on-line and concurrent fault detection, fault and error tolerant systems, and test scheduling and software-based test. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9780769524641 |
| ISBN | 0769524648 (Trade Paper) Active Record |
| Stock number | P2464 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |