ATS 2005 14th Asian Test Symposium (18-21 December 2005/Calcutta, India)
| Author/creator | IEEE Computer Society Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 514 p. 11.000 x 08.500 in. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation Asian Test Symposium 2005 is the fourteenth in a series of annual international symposia on VLSI testing. This symposium provides an open forum for researchers, developers, designers, and industrial practitioners worldwide to exchange ideas on test technology. This year the theme of ATS 2005 is "Embedded Test Technology", and covers all aspects of design for testability, test integration, diagnosis, repair, and yield enhancement of complex chips with embedded digital/analog/memory components. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9780769524818 |
| ISBN | 0769524818 (Trade Paper) Active Record |
| Stock number | P2481 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |