24th IEEE VLSI Test Symposium (VTS 2006) 30 April - 04 May 2006/Berkeley, California
| Author/creator | IEEE Computer Society Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 460 p. 11.000 x 08.500 in. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation VTS 2006 focuses on innovation in the field of testing of integrated circuits and systems. VTS looks at the many trends and challenges in the semiconductor design and manufacturing industries with papers covering wide range of interests, including basic and continuing education for test professionals, the latest research developments, new directions and hot topics in test, and expert perspectives on current issues. The proceedings explores high speed interconnect testing, analog and mixed signal testing, delay testing, flash and memory testing, RF testing, yield analysis, nanoscale testing, IDDQ, MEMS, and wireless testing. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9780769525143 |
| ISBN | 0769525148 (Trade Paper) Active Record |
| Stock number | P2514 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |