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2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings / supported by the Ministry of Higher Education ... [et al.] ; sponsored by ATMEL, Mentor Graphics, ST Microelectronics ; [edited by Patrick Girard ... et al.].
| Author/creator | International Conference on Design & Test of Integrated Systems in Nanoscale Technology |
| Other author | Girard, Patrick, Ph. D. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, N.J. : Institute of Electrical and Electronics Engineers, |
| Description | xviii, 447 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Variant title | 2006 International Conference on Design and Test of Integrated Systems in Nanoscale Technology |
| Portion of title | DTIS 2006 |
| General note | "IEEE Catalog Number: 06EX1441"--P. [i]. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2006927935 |
| ISBN | 0780397266 (softbound ed.) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |