2005 IEEE International Conference on Microelectronic Test Structures
| Author/creator | IEEE, Electron Devices Society Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : I E E E |
| Description | 320 p. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Subjects |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2004115869 |
| ISBN | 9780780388550 |
| ISBN | 0780388550 (Trade Paper) Out of Print |
| Stock number | 05CH37622 00066573 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |