IEEE Std 1149.1-1990 (Includes IEEE Std 1149.1a-1993), IEEE Standard Test Access Port and Boundary-Scan Architecture
| Author/creator | Institute of Electrical and Electronics Engineers, Inc. Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : IEEE |
| Description | 176 p. ill 28.000 x 022.000 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Standards |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9781559373500 |
| ISBN | 1559373504 (Trade Paper) Active Record |
| Standard identifier# | 9781559373500 |
| Stock number | 00066573 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |