Fourth IEEE International Symposium on Electronic Design, Test and Applications : proceedings : [Delta]'08 : 23-25 January 2008, SAR, China / editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology ; with industrial co-sponsorship Celoxica Ltd., UK, Solomon Sytech Limited, HK, National Instruments, HK ; in cooperation with Chinese University of Hong Kong.

Author/creator IEEE International Symposium on Electronic Design, Test and Applications
Format Electronic
Publication InfoLos Alamitos, Calif. : IEEE Computer Society,
Descriptionxxi, 610 p : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Conference Proceedings Archive 2005-2009
Subjects
Electronics--Design. --Congresses.
Electronics--Testing. --Congresses.

Other author/creatorOsseiran, Adam.
Other author/creatorIEEE Computer Society. Technical Council on Test Technology.
Other author/creatorNational Instruments.
Other author/creatorIEEE Hong Kong Section Electron Devices Society.
Other author/creatorHong Kong University of Science and Technology.
Other author/creatorChinese University of Hong Kong.
Other author/creatorIEEE Xplore (Online service)
Cover title International Workshop on Electronic Design, Test and Applications
Added title page DELTA 2008
General noteIn the title, Delta is represented by the Greek letter.
General note"IEEE Computer Society Order Number P3110."--T.p. verso.
Bibliography noteIncludes bibliographical references and author index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2007941926
ISBN9780769531106
ISBN0769531105

Availability

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