Machine vision inspection systems / edited by Muthukumaran Malarvel, Soumya Ranjan Nayak, Sury Narayan Panda, Prasant Kumar Pattnaik and Nittaya Muangnak.
| Format | Electronic |
| Publication Info | Hoboken, NJ : Wiley-Scrivener, 2020. |
| Description | volumes cm. |
| Supplemental Content | Full text available from Ebook Central - Academic Complete |
| Subjects |
| Other author/creator | Malarvel, Muthukumaran. |
| Other author/creator | Nayak, Soumya Ranjan, 1984- |
| Other author/creator | Panda, Sury Narayan. |
| Other author/creator | Pattnaik, Prasant Kumar, 1969- |
| Other author/creator | Muangnak, Nittaya. |
| Incomplete content | Volume 1. Image processing, concepts, methodologies and applications -- |
| Abstract | "Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes the image processing, machine vision and pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Recently, the current automated vision research on machine inspection has gained more popularity with researchers and engineers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examinations during the inspection process, leading to potential disaster. Machine Vision Inspection Systems (MVIS) is better able to avoid false assessment"-- Provided by publisher. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2020020076 |
| ISBN | 9781119681809 (hardback) |
| ISBN | (adobe pdf) |
| ISBN | (epub) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |