Statistical methods for reliability data / William Q. Meeker, Luis A. Escobar.

Author/creator Meeker, William Q.
Other author Escobar, Luis A.
Format Electronic
Publication InfoNew York : Wiley,
Descriptionxxii, 680 p. : ill. ; 25 cm.
Supplemental ContentFull text available from eBooks on EBSCOhost
Subjects

SeriesWiley series in probability and statistics. Applied probability and statistics section
Wiley series in probability and statistics. Applied probability and statistics. ^A368846
General note"A Wiley-Interscience publication."
Bibliography noteIncludes bibliographical references (p. 645-663) and indexes.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 97039270
ISBN0471143286 (cloth : alk. paper)

Availability

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Electronic Resources Access Content Online ✔ Available