Design and analysis of accelerated tests for mission critical reliability / by Michael J. LuValle, Bruce G. Lefevre, SriRaman Kannan.

Author/creator LuValle, Michael J.
Other author Lefevre, Bruce G.
Other author Kannan, SriRaman.
Format Electronic
Publication InfoBoca Raton : Chapman & Hall/CRC,
Description236 p. : ill. ; 24 cm.
Supplemental ContentFull text available from eBooks on EBSCOhost
Subjects

Bibliography noteIncludes bibliographical references (p. 227-229) and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2003069580
ISBN1584884711 (alk. paper)

Availability

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Electronic Resources Access Content Online ✔ Available