Design and analysis of accelerated tests for mission critical reliability / by Michael J. LuValle, Bruce G. Lefevre, SriRaman Kannan.
| Author/creator | LuValle, Michael J. |
| Other author | Lefevre, Bruce G. |
| Other author | Kannan, SriRaman. |
| Format | Electronic |
| Publication Info | Boca Raton : Chapman & Hall/CRC, |
| Description | 236 p. : ill. ; 24 cm. |
| Supplemental Content | Full text available from eBooks on EBSCOhost |
| Subjects |
| Bibliography note | Includes bibliographical references (p. 227-229) and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2003069580 |
| ISBN | 1584884711 (alk. paper) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |