Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.
| Author/creator | Hosmer, David W. |
| Other author | Lemeshow, Stanley. |
| Format | Electronic |
| Publication Info | New York : Wiley, |
| Description | xiii, 307 p. ; 24 cm. |
| Supplemental Content | Full text available from eBooks on EBSCOhost |
| Subjects |
| Series | Wiley series in probability and mathematical statistics. Applied probability and statistics |
| General note | "A Wiley-Interscience publication." |
| Bibliography note | Includes bibliographical references (p. 291-300) and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 89031893 |
| ISBN | 0471615536 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |