SEE test report for analog devices ADP3330 high accuracy, ultralow IQ, 200 mA, SOT-23, anyCAP low dropout regulator / Raymond Ladbury.

Author/creator Ladbury, Raymond L. author.
Other author Goddard Space Flight Center, issuing body.
Format Electronic
PublicationGreenbelt, Maryland : National Aeronautics and Space Administration, Goddard Space Flight Center, June 2021.
Description1 online resource (5 pages) : illustrations (some color).
Supplemental Contenthttps://purl.fdlp.gov/GPO/gpo156892

SeriesNASA/TM ; 20210014982
NASA technical memorandum 20210014982. ^A467613
General note"June 2021."
General note"Test Engineer: Alyson Topper, Test Date: 24-27 October 2014, Report Date: 04 November 2014."
General noteGPO Cataloging Record Distribution Program (CRDP).
Source of descriptionDescription based on online resource, PDF version; title from title page (NASA, viewed on June 24, 2021).
GPO item number0830-D (online)
Govt. docs number NAS 1.15:20210014982

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available