Tools

LEADER 02663cam a2200553Ii 4500

001 ocn953458792;

003 OCoLC;

005 20210728172219.0;

006 m o d f ;

007 cr b||||||||||;

008 160712e199606 ohua obt f000 0 eng d;

035 a| (Sirsi) o953458792;

049 a| ERE#;

074 a| 0830-D (online);

086 0 a| NAS 1.15:107256;

100 1 a| Nuedeck, Philip G.,e| author.=| ^A431853;

245 10 a| Fast risetime reverse bias pulse failures in SiC PN junction diodes /c| Philip G. Nuedeck, Christian Faziz, James D. Parsons.;

264 1 a| Cleveland, Ohio :b| National Aeronautics and Space Administration, Lewis Research Center,c| June 1996.;

300 a| 1 online resource (6 pages) :b| illustrations.;

336 a| textb| txt2| rdacontent;

337 a| computerb| c2| rdamedia;

338 a| online resourceb| cr2| rdacarrier;

490 1 a| NASA technical memorandum ;v| 107256;

500 a| Title from title screen (viewed July 12, 2016).;

500 a| "June 1996"--Report documentation page.;

500 a| "Prepared for the Third International High Temperature Electronics Conference sponsored by the Sandia National Laboratories, Albuquerque, New Mexico, June 9-14, 1996.";

500 a| "Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page.;

500 a| GPO Cataloging Record Distribution Program (CRDP).;

504 a| Includes bibliographical references (page 6).;

536 a| Sponsored by the National Aeronautics and Space Administrationd| WU-505--62-50d| E-10317;

650 7 a| P-N junctions.2| nasat;

650 7 a| Semiconductors (Materials)2| nasat;

650 7 a| Silicon carbides.2| nasat;

650 7 a| High temperature environments.2| nasat;

650 7 a| Bias.2| nasat;

650 7 a| Doped crystals.2| nasat;

650 7 a| Energy gaps (Solid state)2| nasat;

700 1 a| Faziz, Christian,e| author.?| UNAUTHORIZED;

700 1 a| Parsons, James D.,e| author.?| UNAUTHORIZED;

710 2 a| Lewis Research Center,e| issuing body.=| ^A367825;

710 1 a| United States.b| National Aeronautics and Space Administratione| sponsoring body.=| ^A5437;

776 08 i| Microfiche version:a| Nuedeck, Philip G.t| Fast risetime reverse bias pulse failures in SiC PN junction diodesw| (OCoLC)39668882;

830 0 a| NASA technical memorandumv| 107256.=| ^A467613;

856 40 u| https://purl.fdlp.gov/GPO/gpo69224;

949 a| Click on web addressw| asish| joyner94;

596 a| 1;

998 a| 5633746;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5633746-1001l| JNETm| JOYNERr| Ys| Yt| JNE1DOu| 5/21/2021x| EDOCUMENTz| JERESOURCE;

Fast risetime reverse bias pulse failures in SiC PN junction diodes / Philip G. Nuedeck, Christian Faziz, James D. Parsons.

Author/creator	Nuedeck, Philip G. author.
Format	Electronic
Publication	Cleveland, Ohio : National Aeronautics and Space Administration, Lewis Research Center, June 1996.
Description	1 online resource (6 pages) : illustrations.
Supplemental Content	https://purl.fdlp.gov/GPO/gpo69224

Other author/creator	Faziz, Christian, author.
Other author/creator	Parsons, James D., author.
Other author/creator	Lewis Research Center, issuing body.
Other author/creator	United States. National Aeronautics and Space Administration sponsoring body.
Series	NASA technical memorandum ; 107256 NASA technical memorandum 107256. ^A467613
General note	Title from title screen (viewed July 12, 2016).
General note	"June 1996"--Report documentation page.
General note	"Prepared for the Third International High Temperature Electronics Conference sponsored by the Sandia National Laboratories, Albuquerque, New Mexico, June 9-14, 1996."
General note	"Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page.
General note	GPO Cataloging Record Distribution Program (CRDP).
Bibliography note	Includes bibliographical references (page 6).
Funding information	Sponsored by the National Aeronautics and Space Administration WU-505--62-50 E-10317
Issued in other form	Microfiche version: Nuedeck, Philip G. Fast risetime reverse bias pulse failures in SiC PN junction diodes
GPO item number	0830-D (online)
Govt. docs number	NAS 1.15:107256

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Access Content Online	✔ Available

Fast risetime reverse bias pulse failures in SiC PN junction diodes / Philip G. Nuedeck, Christian Faziz, James D. Parsons.

Click here for more information about this title

Availability