Scanning Probe Microscopy of Soft Matter
| Author/creator | Tsukruk, Vladimir V. Author |
| Other author | Singamaneni, Srikanth Author |
| Format | Electronic |
| Publication Info | Wiley-VCH [Imprint] Hoboken : John Wiley & Sons, Incorporated |
| Description | 370 p. 25.000 x 01.500 cm. |
| Supplemental Content | Full text available from Ebook Central - Academic Complete |
| Summary | Annotation Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a widerange of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopyin soft matter research. From the contents:* Atomic Force Microscopy and Other Advanced Imaging Modes* Probing of Mechanical, Thermal Chemical and Electrical Properties* Amorphous, Poorly Ordered and Organized Polymeric Materials* Langmuir-Blodgett and Layer-by-Layer Structures* Multi-Component Polymer Systems and Fibers* Colloids and Microcapsules* Biomaterials and Biological Structures* Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography* Microcantilever-Based Sensors |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9783527639953 |
| ISBN | 3527639950 (Online Resource) Active Record |
| Stock number | 00028608 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |