Scanning Probe Microscopy of Soft Matter Fundamentals and Practices

Author/creator Tsukruk, Vladimir V. Author
Other author Singamaneni,Srikanth Author
Format Electronic
Publication InfoWiley-VCH [Imprint] Hoboken : John Wiley & Sons, Incorporated
Description661 p. 24.350 x 017.600 cm.
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects

Summary Annotation Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9783527327430
ISBN3527327436 (Trade Cloth) Active Record
Standard identifier# 9783527327430
Stock number00028608

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available