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010 a| 2012538041;

020 a| 9783037853818 (hardback);

035 a| (WaSeSS)ssj0000849573;

042 a| lccopycat;

049 a| EREEa| NEHH;

050 00 a| QH212.E4b| I57 2011;

082 04 a| 502.8252| 23;

111 2 a| International Conference on Electron Microscopyn| (14th :d| 2011 :c| Wisła, Poland)?| UNAUTHORIZED;

245 10 a| Electron microscopy XIVh| [electronic resource] :b| selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland /c| edited by Danuta Stróż and Krystian Prusik.;

246 30 a| Electron microscopy 14;

260 a| Durnten-Zurich, Switzerland ;a| Enfield, NH, USA :b| TTP,c| [2012];

300 a| xiii, 346 pages :b| illustrations (some color) ;c| 25 cm.;

490 1 a| Solid state phenomena,x| 1012-0394 ;v| vol. 186;

504 a| Includes bibliographical references and indexes.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Electron microscopyv| Congresses.=| ^A519189;

653 1 a| Electron microscopy;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Stróż, Danuta.?| UNAUTHORIZED;

700 1 a| Prusik, Krystian.?| UNAUTHORIZED;

830 0 a| Diffusion and defect data.n| Pt. B,p| Solid state phenomena ;v| v. 186.x| 1012-0394=| ^A1003549;

856 40 z| Full text available from Ebook Central - Academic Completeu| https://ebookcentral.proquest.com/lib/eastcarolina/detail.action?docID=1872826;

947 a| (OCoLC)ocn801662615;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 5532037;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5532037-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 11/13/2020x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5532037-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 11/13/2020x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5532037-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 11/13/2020x| EBOOKz| JERESOURCE;

Electron microscopy XIV selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland / edited by Danuta Stróż and Krystian Prusik.

Author/creator	International Conference on Electron Microscopy
Other author	Stróż, Danuta.
Other author	Prusik, Krystian.
Format	Electronic
Publication Info	Durnten-Zurich, Switzerland ; Enfield, NH, USA : TTP, [2012]
Description	xiii, 346 pages : illustrations (some color) ; 25 cm.
Supplemental Content	Full text available from Ebook Central - Academic Complete
Subjects	Electron microscopy--Congresses.

Portion of title	Electron microscopy 14
Series	Solid state phenomena, 1012-0394 ; vol. 186 Diffusion and defect data. Pt. B, Solid state phenomena ; v. 186. 1012-0394 ^A1003549
Bibliography note	Includes bibliographical references and indexes.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2012538041
ISBN	9783037853818 (hardback)

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Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Access Content Online	✔ Available

Electron microscopy XIV selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland / edited by Danuta Stróż and Krystian Prusik.

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