Scanning probe microscopy of clay minerals / by A. Blum [and others] ; editors, Kathryn L. Nagy, Alex E. Blum.

Other author Nagy, Kathryn L.
Other author Blum, Alex E.
Other author Clay Minerals Society.
Format Electronic
Publication InfoBoulder, CO : Clay Minerals Society, ©1994.
Description1 online resource (x, 239 pages) : illustrations.
Supplemental ContentGeoScienceWorld
Subjects

SeriesClay Minerals Society workshop lectures ; v. 7
Clay Minerals Society workshop lectures ; v. 7. UNAUTHORIZED
Summary A set of surface-sensitive analytical techniques, collectively called scanning probe microscopy (SPM), has been developed and applied to a wide variety of materials. With SPM one can image nearly any surface in vacuum, in air, or in solution, and often can actually observe surfaces during reaction. Scanning tunneling microscopy (STM) and scanning force microscopy (SFM) have been used successfully in geosciences, and this volume introduces the theory and operation of SPM to clay mineralogists, summarises previous work using STM and SFM in mineralogy, and outlines the advantages and limitations of SPM for future research applications.
Bibliography noteIncludes bibliographical references.
Source of descriptionDescription based on print version record.
Issued in other formPrint version : 9781881208082
ISBN9781881208273 (ebook) :

Availability

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Electronic Resources Access Content Online ✔ Available