62860-2013 - IEC/IEEE Test methods for the characterization of organic transistors and materials

Other author IEEE Xplore (Online service)
Format Electronic
Publication Info[S.l.] : IEEE,
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Standards
Supplemental ContentFull text available from IEEE Electronic Library (IEL)

General noteTitle from content provider.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9780738186856
ISBN0738186856

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