1149.1-2013 - IEEE Standard for Test Access Port and Boundary-Scan Architecture

Other author IEEE Xplore (Online service)
Format Electronic
Publication Info[S.l.] : IEEE,
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Standards

General noteTitle from content provider.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9780738182636
ISBN073818263X

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