2014 9th International Design and Test Symposium (IDT)
| Author/creator | IEEE Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : IEEE |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Summary | Annotation The International Design and Test Symposium is an IEEE sponsored technical event devoted to exploring emerging challenges and novel concepts related to the design and test, automation, reliability of electronic systems ranging from integrated circuits through multi chip modules and printed circuit boards to full systems IDT is a unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region The Symposium is initiated by and in affiliation with the IEEE Test Technology Technical Council (TTTC) |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9781479982011 |
| ISBN | 1479982016 (Spiral) Active Record |
| Stock number | 00066573 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |