Metrology and standardization for nanotechnology protocols and industrial innovations / edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde.

Other author Mansfield, Elisabeth, (Research chemist)
Format Electronic
Publication InfoWeinham : Wiley-VCH Verlag GmbH & Co. KGaA, [2017]
Descriptionxxxii, 594 pages ; illustrations ; 25 cm.
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects

SeriesNanotechnology innovation & applications.
Bibliography noteIncludes bibliographical references at the end of each chapter, and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2023393017
ISBN9783527340392 (print)
ISBN(ePDF)
ISBN(ePUB)

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available