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010 a| 2014022693;

020 a| 9781118479315 (Adobe PDF);

020 a| 9781118479322 (ePub);

020 z| 9781118479292 (cloth : alk. paper);

035 a| (WaSeSS)ssj0001400926;

042 a| pcc;

049 a| EREEa| NEHH;

050 00 a| TK7870.285;

082 00 a| 621.38152| 23;

100 1 a| Ibe, Eishi H.=| ^A1292152;

245 10 a| Terrestrial radiation effects in ULSI devices and electronic systemsh| [electronic resource] /c| Eishi H. Ibe.;

260 a| Singapore :b| John Wiley & Sons Inc.,c| 2015.;

300 a| 1 online resource.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

588 a| Description based on print version record and CIP data provided by publisher.;

650 0 a| Electronic circuitsx| Effect of radiation on.=| ^A28048;

650 0 a| Integrated circuitsx| Ultra large scale integrationx| Reliability.=| ^A906457;

650 0 a| Integrated circuitsx| Effect of radiation on.=| ^A1296806;

655 0 a| Electronic books.=| ^A491897;

776 08 i| Print version:a| Ibe, Eishi H.t| Terrestrial radiation effects in ULSI devices and electronic systemsd| Singapore : John Wiley & Sons Inc., 2015z| 9781118479292w| (DLC) 2014022262;

856 40 z| Full text available from Ebook Central - Academic Completeu| https://ebookcentral.proquest.com/lib/eastcarolina/detail.action?docID=1911831;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 4996426;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4996426-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 12/11/2018x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4996426-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 12/11/2018x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4996426-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 12/11/2018x| EBOOKz| JERESOURCE;

Terrestrial radiation effects in ULSI devices and electronic systems / Eishi H. Ibe.

Author/creator	Ibe, Eishi H.
Format	Electronic
Publication Info	Singapore : John Wiley & Sons Inc., 2015.
Description	1 online resource.
Supplemental Content	Full text available from Ebook Central - Academic Complete
Subjects	Electronic circuits--Effect of radiation on. Integrated circuits--Ultra large scale integration. --Reliability. Integrated circuits--Effect of radiation on.

Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Source of description	Description based on print version record and CIP data provided by publisher.
Issued in other form	Print version: Ibe, Eishi H. Terrestrial radiation effects in ULSI devices and electronic systems Singapore : John Wiley & Sons Inc., 2015 9781118479292
Genre/form	Electronic books.
LCCN	2014022693
ISBN	9781118479315 (Adobe PDF)
ISBN	9781118479322 (ePub)

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Terrestrial radiation effects in ULSI devices and electronic systems / Eishi H. Ibe.

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