2017 IEEE North Atlantic Test Workshop (NATW)
| Author/creator | IEEE Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : IEEE |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Summary | Annotation The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs In addition to traditional topics, the 26th NATW will feature a general theme of Synthesis and Reliability Topics are not limited to, the following Analog, Mixed Signal and RF Testing Built In Self Test (BIST) Board Level Testing Delay and Performance Testing Design Verification Validation Diagnosis and Debug Fault Modeling Simulation FPGA and Embedded Core Testing IDDQ Testing DFM, Defect Analysis and Defect Based Testing Memory and MEMS Testing Nanotechnology Testing Online Testing System on Chip (SoC) Test and DebugTest Quality System Reliability |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9781509059034 |
| ISBN | 1509059032 (Spiral) Active Record |
| Stock number | 00066573 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |